Showing 1 - 20 results of 22 for search 'Lunt, A', query time: 0.06s
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Intragranular residual stress evaluation using the semi-destructive FIB-DIC ring-core drilling method by Lunt, A, Korsunsky, A
Published 2014Conference item -
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On the origins of strain inhomogeneity in amorphous materials by Lunt, A, Chater, P, Korsunsky, A
Published 2018Journal article -
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On the cyclic deformation and residual stress in Ni-base single crystal superalloys by Ying, S, Sui, T, Lunt, A, Reed, R, Korsunsky, A
Published 2014Conference item -
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Nano-scale mapping of lattice strain and orientation inside carbon core SIC fibres by synchrotron X-ray diffraction by Baimpas, N, Lunt, A, Dolbnya, I, Dluhos, J, Korsunsky, A
Published 2014Journal article -
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Full in-plane strain tensor analysis using the microscale ring-core FIB milling and DIC approach by Lunt, A, Salvati, E, Ma, L, Dolbyna, I, Neo, T, Korsunsky, A
Published 2016Journal article -
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Calculations of single crystal elastic constants for yttria partially stabilised zirconia from powder diffraction data by Lunt, A, Xie, M, Baimpas, N, Zhang, S, Kabra, S, Kelleher, J, Neo, T, Korsunsky, A
Published 2014Journal article -
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Understanding nature's residual strain engineering at the human dentine-enamel junction interface by Sui, T, Lunt, A, Baimpas, N, Sandholzer, M, Li, T, Zeng, K, Landini, G, Korsunsky, A
Published 2016Journal article -
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Eigenstrain reconstruction of residual strains in an additively manufactured and shot peened nickel superalloy compressor blade by Salvati, E, Lunt, A, Ying, S, Sui, T, Zhang, H, Heason, C, Baxter, G, Korsunsky, A
Published 2017Journal article -
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A critical comparison between XRD and FIB residual stressmeasurement techniques in thin films by Bemporad, E, Brisotto, M, Depero, L, Gelfi, M, Korsunsky, A, Lunt, A, Sebastiani, M
Published 2014Journal article -
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Digital image correlation of 2D X-ray powder diffraction data for lattice strain evaluation by Zhang, H, Sui, T, Salvati, E, Daisenberger, D, Lunt, A, Fong, K, Song, X, Korsunsky, A
Published 2018Journal article -
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Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis by Korsunsky, A, Salvati, E, Lunt, A, Sui, T, Mughal, M, Daniel, R, Keckes, J, Bemporad, E, Sebastiani, M
Published 2018Journal article -
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