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Variability and high temperature reliability of graphene field-effect transistors with thin epitaxial CaF2 insulators by Yu. Yu. Illarionov, T. Knobloch, B. Uzlu, A. G. Banshchikov, I. A. Ivanov, V. Sverdlov, M. Otto, S. L. Stoll, M. I. Vexler, M. Waltl, Z. Wang, B. Manna, D. Neumaier, M. C. Lemme, N. S. Sokolov, T. Grasser
Published 2024-03-01
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