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Nanofabricated free-standing wire scanners for beam diagnostics with submicrometer resolution by G. L. Orlandi, C. David, E. Ferrari, V. A. Guzenko, R. Ischebeck, E. Prat, B. Hermann, M. Ferianis, G. Penco, M. Veronese, N. Cefarin, S. Dal Zilio, M. Lazzarino
Published 2020-04-01
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