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  1. 1
    Highly-stable black phosphorus field-effect transistors with low density of oxide traps

    Highly-stable black phosphorus field-effect transistors with low density of oxide traps by Yu. Yu. Illarionov, M. Waltl, G. Rzepa, T. Knobloch, J.-S. Kim, D. Akinwande, T. Grasser

    Published 2017-07-01
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    Article
  2. 2
    Variability and high temperature reliability of graphene field-effect transistors with thin epitaxial CaF2 insulators

    Variability and high temperature reliability of graphene field-effect transistors with thin epitaxial CaF2 insulators by Yu. Yu. Illarionov, T. Knobloch, B. Uzlu, A. G. Banshchikov, I. A. Ivanov, V. Sverdlov, M. Otto, S. L. Stoll, M. I. Vexler, M. Waltl, Z. Wang, B. Manna, D. Neumaier, M. C. Lemme, N. S. Sokolov, T. Grasser

    Published 2024-03-01
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    Article

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