Bragg diffraction using a 100 ps 17.5 keV x-ray backlighter and the Bragg diffraction imager. by Maddox, B, Park, H, Hawreliak, J, Elsholz, A, Van Maren, R, Remington, B, Comley, A, Wark, J

K-alpha and bremsstrahlung x-ray radiation backlighter sources from short pulse laser driven silver targets as a function of laser pre-pulse energy by Jarrott, L, Kemp, A, Divol, L, Mariscal, D, Westover, B, McGuffey, C, Beg, F, Suggit, M, Chen, C, Hey, D, Maddox, B, Hawreliak, J, Park, H, Remington, B, Wei, MS, MacPhee, A

Strength of shock-loaded single-crystal tantalum [100] determined using in situ broadband x-ray Laue diffraction. by Comley, A, Maddox, B, Rudd, R, Prisbrey, S, Hawreliak, J, Orlikowski, D, Peterson, S, Satcher, J, Elsholz, A, Park, H, Remington, B, Bazin, N, Foster, J, Graham, P, Park, N, Rosen, P, Rothman, SR, Higginbotham, A, Suggit, M, Wark, J

Comley et al. reply. by Comley, A, Maddox, B, Rudd, R, Barton, N, Wehrenberg, C, Prisbrey, S, Hawreliak, J, Orlikowski, D, Peterson, S, Satcher, J, Elsholz, A, Park, H, Remington, B, Bazin, N, Foster, J, Graham, P, Park, N, Rosen, P, Rothman, S, Higginbotham, A, Suggit, M, Wark, J