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    Electronic decoupling by h-BN layer between silicene and Cu(111): A DFT-based analysis

    Electronic decoupling by h-BN layer between silicene and Cu(111): A DFT-based analysis by Mao Kanno, Ryuichi Arafune, Chun Liang Lin, Emi Minamitani, Maki Kawai, Noriaki Takagi

    Published 2014-01-01
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