Deep-Learning-Based Defective Bean Inspection with GAN-Structured Automated Labeled Data Augmentation in Coffee Industry by Yung-Chien Chou, Cheng-Ju Kuo, Tzu-Ting Chen, Gwo-Jiun Horng, Mao-Yuan Pai, Mu-En Wu, Yu-Chuan Lin, Min-Hsiung Hung, Wei-Tsung Su, Yi-Chung Chen, Ding-Chau Wang, Chao-Chun Chen

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