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On the Understanding of Cathode Related Trapping Effects in GaN-on-Si Schottky Diodes by Thomas Lorin, William Vandendaele, Romain Gwoziecki, Yannick Baines, Jerome Biscarrat, Marie-Anne Jaud, Charlotte Gillot, Matthew Charles, Marc Plissonnier, G. Ghibaudo, F. Gaillard
Published 2018-01-01
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