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Examination of thermal properties and degradation of InGaN - based diode lasers by thermoreflectance spectroscopy and focused ion beam etching by Dorota Pierścińska, Kamil Pierściński, Mariusz Płuska, Łucja Marona, Przemysław Wiśniewski, Piotr Perlin, Maciej Bugajski
Published 2017-07-01
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