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    In Situ Fabrication, Manipulation, and Mechanical Characterization of Free‐Standing Silica Thin Films Using Focused Ion Beam Scanning Electron Microscopy

    In Situ Fabrication, Manipulation, and Mechanical Characterization of Free‐Standing Silica Thin Films Using Focused Ion Beam Scanning Electron Microscopy by Mohammad Soleimani, Sai P. Maddala, Martijn Wismans, Wei‐Chih Liao, Lambèrt C. A. vanBreemen, Rolf A. T. M. vanBenthem, Heiner Friedrich

    Published 2022-04-01
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