High dose efficiency atomic resolution imaging via electron ptychography od Pennycook, TJ, Martinez, GT, Nellist, PD, Meyer, JC

Contrast transfer and noise considerations in focused-probe electron ptychography od O'Leary, CM, Martinez, GT, Liberti, E, Humphry, MJ, Kirkland, AI, Nellist, PD

Contrast transfer and noise minimization in electron ptychography od O'Leary, CM, Martinez, GT, Liberti, E, Humphry, MJ, Kirkland, AI, Nellist, PD

Significant performance improvement in n-channel organic field-effect transistors with C60:C70 co-crystals induced by poly(2-ethyl-2-oxazoline) nanodots od Nam, S, Khim, D, Martinez, GT, Varambhia, A, Nellist, PD, Kim, Y, Anthopoulos, TD, Bradley, DDC

The effect of dynamical scattering on single-plane phase retrieval in electron ptychography od Clark, L, Martinez, GT, O’Leary, CM, Yang, H, Ding, Z, Petersen, TC, Findlay, SD, Nellist, PD