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Microstructuring YbRh2Si2 for resistance and noise measurements down to ultra-low temperatures by Alexander Steppke, Sandra Hamann, Markus König, Andrew P Mackenzie, Kristin Kliemt, Cornelius Krellner, Marvin Kopp, Martin Lonsky, Jens Müller, Lev V Levitin, John Saunders, Manuel Brando
Published 2022-01-01
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