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Investigations on Long-Range AFM Scans Using a Nanofabrication Machine (NFM-100) by Jaqueline Stauffenberg, Ingo Ortlepp, Christoph Reuter, Mathias Holz, Denis Dontsov, Christoph Schäffel, Steffen Strehle, Jens-Peter Zöllner, Ivo W. Rangelow, Eberhard Manske
Published 2020-12-01
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