Progressive proximal loosening of initially well-fixed bilateral Corail stems: a case report and review of the literature by Michael G Johnston, Kade E Eppich, Celeste Gray, Matthew A Porter, David F Scott

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Optimizing performance and yield of vertical GaN diodes using wafer scale optical techniques by James C. Gallagher, Mona A. Ebrish, Matthew A. Porter, Alan G. Jacobs, Brendan P. Gunning, Robert J. Kaplar, Karl D. Hobart, Travis J. Anderson

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The Joint Awareness Score: A Shortened, Simplified, Improved Alternative to the Forgotten Joint Score by Matthew A. Porter, BS, Michael G. Johnston, MA, Clark Kogan, PhD, Celeste G. Gray, BS, Kade E. Eppich, BS, David F. Scott, MD

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Impact of Anode Thickness on Breakdown Mechanisms in Vertical GaN PiN Diodes with Planar Edge Termination by Mona A. Ebrish, Matthew A. Porter, Alan G. Jacobs, James C. Gallagher, Robert J. Kaplar, Brendan P. Gunning, Karl D. Hobart, Travis J. Anderson

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