Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles 由 Nicolas Feltin, Loïc Crouzier, Alexandra Delvallée, Francesco Pellegrino, Valter Maurino, Dorota Bartczak, Heidi Goenaga-Infante, Olivier Taché, Sylvie Marguet, Fabienne Testard, Sébastien Artous, François Saint-Antonin, Christoph Salzmann, Jérôme Deumer, Christian Gollwitzer, Richard Koops, Noham Sebaïhi, Richard Fontanges, Matthias Neuwirth, Detlef Bergmann, Dorothee Hüser, Tobias Klein, Vasile-Dan Hodoroaba

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