Introduction to the Special Issue: Modern Methods and Avoiding Errors in Surface Analysis by Joshua W. Pinder, Jacob D. Crossman, Braxton Kulbacki, Matthijs A. van Spronsen, Jonas Baltrusaitis, Matthew R. Linford

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An electrochemical flow cell for operando XPS and NEXAFS investigation of solid–liquid interfaces by Santosh Kumar, James J C Counter, David C Grinter, Matthijs A Van Spronsen, Pilar Ferrer, Alex Large, Marcin W Orzech, Pawel Jerzy Wojcik, Georg Held

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Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters by Joshua W. Pinder, George H. Major, Donald R. Baer, Jeff Terry, James E. Whitten, Jan Čechal, Jacob D. Crossman, Alvaro J. Lizarbe, Samira Jafari, Christopher D. Easton, Jonas Baltrusaitis, Matthijs A. van Spronsen, Matthew R. Linford

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VerSoX B07-B: a high-throughput XPS and ambient pressure NEXAFS beamline at Diamond Light Source by David C. Grinter, Pilar Ferrer, Federica Venturini, Matthijs A. van Spronsen, Alexander I. Large, Santosh Kumar, Maximilian Jaugstetter, Alex Iordachescu, Andrew Watts, Sven L. M. Schroeder, Anna Kroner, Federico Grillo, Stephen M. Francis, Paul B. Webb, Matthew Hand, Andrew Walters, Michael Hillman, Georg Held

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Tuning the selectivity of NH3 oxidation via cooperative electronic interactions between platinum and copper sites by Lu Chen, Xuze Guan, Zhaofu Fei, Hiroyuki Asakura, Lun Zhang, Zhipeng Wang, Xinlian Su, Zhangyi Yao, Luke L. Keenan, Shusaku Hayama, Matthijs A. van Spronsen, Burcu Karagoz, Georg Held, Christopher S. Allen, David G. Hopkinson, Donato Decarolis, June Callison, Paul J. Dyson, Feng Ryan Wang

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