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Aligned T-gate, fabrication using X-ray lithography by Meinhold, Mitchell W., 1972-
Published 2008
Thesis -
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Nanostructures, Technology, Research, and Applications by Smith, Henry I., Silverman, Scott E., Ferrera, Juan, Carter, James M., Lim, Michael H. Y., Moon, Euclid E., Wong, Vincent V., Yang, Isabel Y., Burkhardt, Martin, Franke, Andrea E., Mondol, Mark K., Murphy, Edward, Everett, Patrick N., Fleming, Robert C., Jr., Savas, Timothy A., Schattenburg, Mark L., Shah, Satyen N., Thompson, Carl V., Yasaka, Anto, Jackson, Keith M., Antoniadis, Dimitri A., Meinhold, Mitchell W., Carter, David J., Sokolinski, Ilia, Melloch, Michael R., Orlando, Terry P., Pepin, Anne, Schweizer, Mark R., Berman, David B., Ashoori, Raymond C., Marley, Elisabeth A., Murphy, Thomas E., Kolodziejski, Leslie A., Damask, Jay N., Haus, Hermann A., Aucoin, Richard J., Canizares, Claude R., Porter, Jeanne M.
Published 2010
Technical Report -
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Nanostructures, Technology, Research, and Applications by Smith, Henry I., Goodberlet, James G., Ferrera, Juan, Mondol, Mark K., Carter, David J., Carter, James M., Daley, James M., Lim, Michael H. Y., Moon, Euclid E., Schweizer, Mark R., Mao, Wendy, Murphy, Edward R., Yang, Isabel Y., Yuan, Jing, Everett, Patrick N., Farhoud, Maya S., Fleming, Robert C., Jr., Savas, Timothy A., Schattenburg, Mark L., Jackson, Keith M., Antoniadis, Dimitri A., Lochtefeld, Anthony, Chandrakasan, Anantha P., Meinhold, Mitchell W., Sokolinski, Ilia, Melloch, Michael R., Orlando, Terry P., Pepin, Anne, Berman, David B., Ashoori, Raymond C., Foresi, James S., Villeneuve, Pierre R., Joannopoulos, John D., Kimerling, Lionel C., Damask, Jay N., Murphy, Thomas E., Haus, Hermann A., Kolodziejski, Leslie A., Porter, Jeanne M., Prentiss, Jane D., Sisson, Robert D., van Beek, Joost, Canizares, Claude R., Franke, Andrea E.
Published 2010
Technical Report -
5
Nanostructures Technology, Research, and Applications by Smith, Henry I., Mondol, Mark K., Goodberlet, James G., Bernshteyn, Alex, Ferrera, Juan, Carter, David J., Schweizer, Mark R., Daley, James M., Lim, Michael H. Y., Moon, Euclid E., Djohmehri, Ihsan, Savas, Timothy A., Carter, James M., Murphy, Edward R., Everett, Patrick N., Lee, Jawoong, Farhoud, Maya S., Fleming, Robert C., Jr., Schattenburg, Mark L., Ross, Caroline A., Youcef-Toumi, Kamal, Bae, Jungmok M., Hwang, M., Jackson, Keith M., Lee, Zachary K., Antoniadis, Dimitri A., Lochtefeld, Anthony, Sokolinski, Ilia, Chung, James E., Meinhold, Mitchell W., Berman, David B., Ashoori, Raymond C., Fan, Shanhui, Foresi, James S., Steinmeyer, Günter, Thoen, Erik R., Villeneuve, Pierre R., Ippen, Erich P., Joannopoulos, John D., Kimerling, Lionel C., Qi, Minghao, Damask, Jay N., Khan, Mohammed Jalal, Koontz, Elisabeth M., Murphy, Thomas E., Kolodziejski, Leslie A., Haus, Hermann A., van Beek, Joost, Hindle, P., Porter, Jeannie M., Prentiss, Jane D., Sisson, Robert D., Canizares, Claude R., Franke, Andrea E., Pflug, David, Akinwande, Akintunde I., Bozler, Carl, Rana, Farhan, Marley, Elisabeth A., Ram, Rajeev J.
Published 2010
Technical Report