PECVD SiNx passivation with more than 8 MV/cm breakdown strength for GaN-on-Si wafer stress management by Matthias Moser, Mamta Pradhan, Mohammed Alomari, Michael Heuken, Thomas Schmitt, Ingmar Kallfass, Joachim N. Burghartz

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Physical Modeling of Charge Trapping Effects in GaN/Si Devices and Incorporation in the ASM-HEMT Model by Mamta Pradhan, Mohammed Alomari, Matthias Moser, Dirk Fahle, Herwig Hahn, Michael Heuken, Joachim N. Burghartz

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Optimization of Layer Transfer and Photolithography for Device Integration of 2D-TMDC by Amir Ghiami, Tianyishan Sun, Hleb Fiadziushkin, Songyao Tang, Annika Grundmann, Michael Heuken, Holger Kalisch, Andrei Vescan

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CVD graphene-MoS2 Van der Waals heterostructures on the millimeter-scale by Nico Rademacher, Eros Reato, Lukas Völkel, Annika Grundmann, Michael Heuken, Holger Kalisch, Andrei Vescan, Alwin Daus, Max C. Lemme

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Impact of Carbon Impurities on Air Stability of MOCVD 2D-MoS₂ by Amir Ghiami, Annika Grundmann, Songyao Tang, Hleb Fiadziushkin, Zhaodong Wang, Stephan Aussen, Susanne Hoffmann-Eifert, Michael Heuken, Holger Kalisch, Andrei Vescan

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Atomically resolved electronic properties in single layer graphene on α-Al2O3 (0001) by chemical vapor deposition by Henrik Wördenweber, Silvia Karthäuser, Annika Grundmann, Zhaodong Wang, Stephan Aussen, Holger Kalisch, Andrei Vescan, Michael Heuken, Rainer Waser, Susanne Hoffmann-Eifert

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Optical Properties and Growth Characteristics of 8-Quinolinolato Lithium (Liq) Nano-Layers Deposited by Gas Transport Deposition by Alexandros Zachariadis, Michalis Chatzidis, Despoina Tselekidou, Olaf Wurzinger, Dietmar Keiper, Peter K. Baumann, Michael Heuken, Kyparisis Papadopoulos, Argiris Laskarakis, Stergios Logothetidis, Maria Gioti

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A Small Step for Epitaxy, a Large Step Toward Twist Angle Control in 2D Heterostructures by Oliver Maßmeyer, Jürgen Belz, Badrosadat Ojaghi Dogahe, Maximilian Widemann, Robin Günkel, Johannes Glowatzki, Max Bergmann, Sergej Pasko, Simonas Krotkus, Michael Heuken, Andreas Beyer, Kerstin Volz

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Understanding the impact of heavy ions and tailoring the optical properties of large-area monolayer WS2 using focused ion beam by Fahrettin Sarcan, Nicola J. Fairbairn, Panaiot Zotev, Toby Severs-Millard, Daniel J. Gillard, Xiaochen Wang, Ben Conran, Michael Heuken, Ayse Erol, Alexander I. Tartakovskii, Thomas F. Krauss, Gordon J. Hedley, Yue Wang

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Button shear testing for adhesion measurements of 2D materials by Josef Schätz, Navin Nayi, Jonas Weber, Christoph Metzke, Sebastian Lukas, Jürgen Walter, Tim Schaffus, Fabian Streb, Eros Reato, Agata Piacentini, Annika Grundmann, Holger Kalisch, Michael Heuken, Andrei Vescan, Stephan Pindl, Max C. Lemme

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