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Cu-Doped TiN<sub>x</sub>O<sub>y</sub> Thin Film Resistors DC/RF Performance and Reliability by Lev V. Shanidze, Anton S. Tarasov, Mikhail V. Rautskiy, Fyodor V. Zelenov, Stepan O. Konovalov, Ivan V. Nemtsev, Alexander S. Voloshin, Ivan A. Tarasov, Filipp A. Baron, Nikita V. Volkov
Published 2021-08-01
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