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  1. 1
    Ferroelectric-like behavior in HfO2/Al2O3/AlN metal-insulator-semiconductor capacitor through AlN thermal stress

    Ferroelectric-like behavior in HfO2/Al2O3/AlN metal-insulator-semiconductor capacitor through AlN thermal stress by Min-Lu Kao, Yuan Lin, You-Chen Weng, Chang-Fu Dee, Edward Yi Chang

    Published 2022-01-01
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  2. 2
    Buffer Traps Effect on GaN-on-Si High-Electron-Mobility Transistor at Different Substrate Voltages

    Buffer Traps Effect on GaN-on-Si High-Electron-Mobility Transistor at Different Substrate Voltages by Yuan Lin, Min-Lu Kao, You-Chen Weng, Chang-Fu Dee, Shih-Chen Chen, Hao-Chung Kuo, Chun-Hsiung Lin, Edward-Yi Chang

    Published 2022-12-01
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