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Subsurface damage analysis by TEM and 3D FIB crack mapping in alumina and alumina/5vol.%SiC nanocomposites by Wu, H, Roberts, S, Mobus, G, Inkson, B
Published 2003Journal article -
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Prospective applications for a double-C-s-corrector TEM/STEM by Mobus, G, Titchmarsh, J, Hutchison, J, Hetherington, C, Doole, R, Cockayne, D
Published 2001Conference item