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Damage mechanics-based model for reliability assessment of through-silicon via interconnects / by Mohammad Amirul Affiz Afripin, 1987-, author 541882, Mohd. Nasir Tamin, supervisor 304103, Nor Akmal Fadil, supervisor 576681, Fakulti Kejuruteraan - Sekolah Kejuruteraan Mekanikal 619080
Published 2020
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