Showing 1 - 19 results of 19 for search 'Moldovan, G', query time: 0.05s
Refine Results
-
1
Imaging electron detectors for low-voltage TEM by Moldovan, G, Kirkland, A
Published 2010Conference item -
2
Direct Detectors for Electron Microscopy by Clough, R, Moldovan, G, Kirkland, A
Published 2014Conference item -
3
Can direct electron detectors outperform phosphor-CCD systems for TEM? by Moldovan, G, Li, X, Kirkland, A
Published 2008Conference item -
4
Counting electrons in transmission electron microscopes by Moldovan, G, Li, X, Wilshaw, P, Kirkland, A
Published 2008Journal article -
5
Thin silicon strip devices for direct electron detection in transmission electron microscopy by Moldovan, G, Li, X, Wilshaw, P, Kirkland, A
Published 2008Conference item -
6
Imaging modes for direct electron detection in TEM with column parallel CCD by Moldovan, G, Jeffery, B, Nomerotski, A, Kirkland, A
Published 2009Conference item -
7
Characterisation of a detector based on microchannel plates for electrons in the energy range 10-20 keV by Moldovan, G, Matheson, J, Derbyshire, G, Kirkland, A
Published 2008Journal article -
8
Direct electron detection for TEM with column parallel CCD by Moldovan, G, Jeffery, B, Nomerotski, A, Kirkland, A
Published 2009Conference item -
9
-
10
Testing and comparison of imaging detectors for electrons in the energy range 10-20 keV by Matheson, J, Moldovan, G, Kirkland, A, Allinson, N, Abrahams, J
Published 2017Conference item -
11
Direct detection of electron backscatter diffraction patterns. by Wilkinson, A, Moldovan, G, Britton, T, Bewick, A, Clough, R, Kirkland, A
Published 2013Journal article -
12
Characterisation of a counting imaging detector for electron detection in the energy range 10-20 keV by Moldovan, G, Sikharulidze, I, Matheson, J, Derbyshire, G, Kirkland, A, Abrahams, J
Published 2012Journal article -
13
Toward electron exit wave tomography of amorphous materials at atomic resolution by Borisenko, K, Moldovan, G, Kirkland, A, Van Dyck, D, Tang, H, Chen, F
Published 2012Journal article -
14
Toward electron exit wave tomography of amorphous materials at atomic resolution by Borisenko, K, Moldovan, G, Kirkland, A, Van Dyck, D, Tang, H, Chen, F
Published 2012Journal article -
15
Toward 3D structural information from quantitative electron exit wave analysis by Borisenko, K, Moldovan, G, Kirkland, A, Wang, A, Van Dyck, D, Chen, F
Published 2012Journal article -
16
Characterisation of a monolithic active pixel sensor for electron detection in the energy range 10-20 keV by Matheson, J, Moldovan, G, Clark, A, Prydderch, M, Turchetta, R, Derbyshire, G, Kirkland, A, Allinson, N
Published 2009Journal article -
17
Characterization of a direct detection device imaging camera for transmission electron microscopy by Milazzo, A, Moldovan, G, Lanman, J, Jin, L, Bouwer, J, Klienfelder, S, Peltier, S, Ellisman, M, Kirkland, A, Xuong, N
Published 2010Journal article -
18
Characterization of a direct detection device imaging camera for transmission electron microscopy. by Milazzo, A, Moldovan, G, Lanman, J, Jin, L, Bouwer, J, Klienfelder, S, Peltier, S, Ellisman, M, Kirkland, A, Xuong, N
Published 2010Journal article -
19
Characterization of a direct detection device imaging camera for transmission electron microscopy by Milazzo, A, Moldovan, G, Lanman, J, Jin, L, Bouwer, J, Klienfelder, S, Peltier, S, Ellisman, M, Kirkland, A, Xuong, N
Published 2010Journal article