Single shot measurement of a silicon single electron transistor by Hasko, D, Ferrus, T, Morrissey, Q, Burge, SR, Freeman, E, French, M, Lam, A, Creswell, L, Collier, R, Williams, D, Briggs, G

Cryogenic instrumentation for fast current measurement in a silicon single electron transistor by Ferrus, T, Hasko, D, Morrissey, Q, Burge, SR, Freeman, E, French, M, Lam, A, Creswell, L, Collier, R, Williams, D, Briggs, G

CMOS Monolithic Active Pixel Sensors (MAPS): New 'eyes' for science by Turchetta, R, Allport, P, Casse, G, Clark, A, Crooks, J, Evans, A, Fant, A, Faruqi, A, French, M, Henderson, R, Morrissey, Q, Prior, D, Prydderch, M, Velthuis, J, Villani, G, Waltham, N, Willmore, B, Willmore, P