Special Issue “EUV and X-ray Wavefront Sensing” by Mourad Idir, Daniele Cocco, Lei Huang

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Statistical Tool Size Study for Computer-Controlled Optical Surfacing by Weslin C. Pullen, Tianyi Wang, Heejoo Choi, Xiaolong Ke, Vipender S. Negi, Lei Huang, Mourad Idir, Daewook Kim

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Hybrid height and slope figuring method for grazing-incidence reflective optics by Tianyi Wang, Lei Huang, Xiaolong Ke, Yi Zhu, Heejoo Choi, Weslin Pullen, Vipender Negi, Daewook Kim, Mourad Idir

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EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging by Ombeline de La Rochefoucauld, Guillaume Dovillaire, Fabrice Harms, Mourad Idir, Lei Huang, Xavier Levecq, Martin Piponnier, Philippe Zeitoun

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A comprehensive review of dwell time optimization methods in computer-controlled optical surfacing by Tianyi Wang, Xiaolong Ke, Lei Huang, Qingqing Cui, Zili Zhang, Chunjin Wang, Hyukmo Kang, Weslin Pullen, Heejoo Choi, Daewook Kim, Vipender Negi, Qian Kemao, Yi Zhu, Stefano Giorgio, Philip Boccabella, Nathalie Bouet, Corey Austin, Mourad Idir

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