In Situ TEM Observation of Electron‐Beam‐Induced Microstructural Evolution in van der Waals Layered Magnetic CrSBr Semiconductor by Hao‐Wen Deng, Yi‐Tang Tseng, Mu‐Pai Lee, Yen‐Fu Lin, Wen‐Wei Wu

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Oxidation-boosted charge trapping in ultra-sensitive van der Waals materials for artificial synaptic features by Feng-Shou Yang, Mengjiao Li, Mu-Pai Lee, I-Ying Ho, Jiann-Yeu Chen, Haifeng Ling, Yuanzhe Li, Jen-Kuei Chang, Shih-Hsien Yang, Yuan-Ming Chang, Ko-Chun Lee, Yi-Chia Chou, Ching-Hwa Ho, Wenwu Li, Chen-Hsin Lien, Yen-Fu Lin

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Reversible Charge‐Polarity Control for Multioperation‐Mode Transistors Based on van der Waals Heterostructures by Ciao‐Fen Chen, Shih‐Hsien Yang, Che‐Yi Lin, Mu‐Pai Lee, Meng‐Yu Tsai, Feng‐Shou Yang, Yuan‐Ming Chang, Mengjiao Li, Ko‐Chun Lee, Keiji Ueno, Yumeng Shi, Chen‐Hsin Lien, Wen‐Wei Wu, Po‐Wen Chiu, Wenwu Li, Shun‐Tsung Lo, Yen‐Fu Lin

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