Investigation of Temperature and Channel Dimension Effects on CMOS Circuit Performance by Zitouni Messai, Abdelhalim Brahimi, Okba Saidani, Nacerdine Bourouba, Abderrahim Yousfi

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Fault Coverage Improvement of CMOS Analog Circuits Using Supply Current Testing Method by Abderrazak Arabi, Mouloud Ayad, Mourad Benziane, Nacerdine Bourouba, Abdesslam Belaout

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An efficient method for faults diagnosis in analog circuits based on machine learning classifiers by Abderrazak Arabi, Mouloud Ayad, Nacerdine Bourouba, Mourad Benziane, Issam Griche, Sherif S.M. Ghoneim, Enas Ali, Mahmoud Elsisi, Ramy N.R. Ghaly

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