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    High-resolution dislocation imaging and micro-structural analysis of HVPE-βGa2O3 films using monochromatic synchrotron topography

    High-resolution dislocation imaging and micro-structural analysis of HVPE-βGa2O3 films using monochromatic synchrotron topography by Nadeemullah A. Mahadik, Marko J. Tadjer, Peter L. Bonanno, Karl D. Hobart, Robert E. Stahlbush, Travis J. Anderson, Akito Kuramata

    Published 2019-02-01
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