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Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin fi... door Wilkinson, A, Vilalta-Clemente, A, Naresh-Kumar, G, Nouf-Allehiani, M, Gamarra, P, di Forte-Poisson, M, Trager-Cowan, C
Gepubliceerd in 2016Journal article -
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Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope. door Naresh-Kumar, G, Hourahine, B, Edwards, P, Day, A, Winkelmann, A, Wilkinson, A, Parbrook, P, England, G, Trager-Cowan, C
Gepubliceerd in 2012Journal article -
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High-resolution electron backscatter diffraction in III-nitride semiconductors door Vilalta-Clemente, A, Naresh-Kumar, G, Nouf Allehiani, M, Parbrook, P, Boulbar, E, Allsopp, D, Shields, P, Trager-Cowan, C, Wilkinson, A
Gepubliceerd in 2015Conference item -
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Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light-electron microscopy door Naresh-Kumar, G, Edwards, PR, Batten, T, Nouf-Allehiani, M, Vilalta-Clemente, A, Wilkinson, AJ, Le Boulbar, E, Shields, PA, Starosta, B, Hourahine, B, Martin, RW, Trager-Cowan, C
Gepubliceerd in 2022Journal article