Z-Scan theory for thin film measurements: Validation of a model beyond the standard approach using ITO and HfO2 অনুযায়ী Andrea Tognazzi, Paolo Franceschini, Thi Ngoc Lam Tran, Alessandro Chiasera, Maria Antonietta Vincenti, Alfonso Carmelo Cino, Neset Akozbek, Michael Scalora, Costantino De Angelis

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