Impact of interface traps on charge noise and low-density transport properties in Ge/SiGe heterostructures por Leonardo Massai, Bence Hetényi, Matthias Mergenthaler, Felix J. Schupp, Lisa Sommer, Stephan Paredes, Stephen W. Bedell, Patrick Harvey-Collard, Gian Salis, Andreas Fuhrer, Nico W. Hendrickx

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