Surface potential imaging and characterizations of a GaN p-n junction with Kelvin probe force microscopy by Tomonori Nakamura, Nobuyuki Ishida, Keisuke Sagisaka, Yasuo Koide

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Mapping stress inside living cells by atomic force microscopy in response to environmental stimuli by Hongxin Wang, Han Zhang, Ryo Tamura, Bo Da, Shimaa A. Abdellatef, Ikumu Watanabe, Nobuyuki Ishida, Daisuke Fujita, Nobutaka Hanagata, Tomoki Nakagawa, Jun Nakanishi

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