Showing 1 - 6 results of 6 for search 'Noriyuki Hasuike', query time: 0.03s Refine Results
  1. 1
    Decomposition of the anisotropic strain in 3D-structure GaN layers using Raman spectroscopy

    Decomposition of the anisotropic strain in 3D-structure GaN layers using Raman spectroscopy by Kazuma Takeuchi, Hiroyuki Ogura, Noriyuki Hasuike, Takeshi Kamikawa

    Published 2024-02-01
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  2. 2
    Growth of indium-incorporated κ-Ga2O3 thin film lattice-matched to the ε-GaFeO3 substrate

    Growth of indium-incorporated κ-Ga2O3 thin film lattice-matched to the ε-GaFeO3 substrate by Hiroyuki Nishinaka, Osamu Ueda, Noriaki Ikenaga, Noriyuki Hasuike, Masahiro Yoshimoto

    Published 2022-06-01
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  3. 3
    Surface Plasmon Resonances in Sn: In<sub>2</sub>O<sub>3</sub> Thin Films with Diffraction Grating

    Surface Plasmon Resonances in Sn: In<sub>2</sub>O<sub>3</sub> Thin Films with Diffraction Grating by Noriyuki Hasuike, Saito Ochiai, Ryotaro Iwakiri, Minoru Takeda, Woo Sik Yoo, Toshiyuki Isshiki

    Published 2018-11-01
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  4. 4
    Single-Domain and Atomically Flat Surface of κ‑Ga2O3 Thin Films on FZ-Grown ε‑GaFeO3 Substrates via Step-Flow Growth Mode

    Single-Domain and Atomically Flat Surface of κ‑Ga2O3 Thin Films on FZ-Grown ε‑GaFeO3 Substrates via Step-Flow Growth Mode by Hiroyuki Nishinaka, Osamu Ueda, Daisuke Tahara, Yusuke Ito, Noriaki Ikenaga, Noriyuki Hasuike, Masahiro Yoshimoto

    Published 2020-11-01
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  5. 5
    Contactless monitoring of Ge content and B concentration in ultrathin single and double layer Si1-xGex epitaxial films using multiwavelength micro-Raman spectroscopy

    Contactless monitoring of Ge content and B concentration in ultrathin single and double layer Si1-xGex epitaxial films using multiwavelength micro-Raman spectroscopy by Chun-Wei Chang, Min-Hao Hong, Wei-Fan Lee, Kuan-Ching Lee, Shiu-Ko Jang Jian, Yen Chuang, Yu-Ta Fan, Noriyuki Hasuike, Hiroshi Harima, Takeshi Ueda, Toshikazu Ishigaki, Kitaek Kang, Woo Sik Yoo

    Published 2012-03-01
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  6. 6
    In-line Si1-xGex epitaxial process monitoring and diagnostics using multiwavelength high resolution micro-Raman spectroscopy

    In-line Si1-xGex epitaxial process monitoring and diagnostics using multiwavelength high resolution micro-Raman spectroscopy by Chun-Wei Chang, Min-Hao Hong, Wei-Fan Lee, Kuan-Ching Lee, Shen-Min Yang, Ming-Shan Tsai, Yen Chuang, Yu-Ta Fan, Noriyuki Hasuike, Hiroshi Harima, Takeshi Ueda, Toshikazu Ishigaki, Kitaek Kang, Woo Sik Yoo

    Published 2012-06-01
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