Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin fi... by Wilkinson, A, Vilalta-Clemente, A, Naresh-Kumar, G, Nouf-Allehiani, M, Gamarra, P, di Forte-Poisson, M, Trager-Cowan, C

High-resolution electron backscatter diffraction in III-nitride semiconductors by Vilalta-Clemente, A, Naresh-Kumar, G, Nouf Allehiani, M, Parbrook, P, Boulbar, E, Allsopp, D, Shields, P, Trager-Cowan, C, Wilkinson, A

Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light-electron microscopy by Naresh-Kumar, G, Edwards, PR, Batten, T, Nouf-Allehiani, M, Vilalta-Clemente, A, Wilkinson, AJ, Le Boulbar, E, Shields, PA, Starosta, B, Hourahine, B, Martin, RW, Trager-Cowan, C