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X-ray diffraction studies of the growth process of thin films of high-entropy TiNbZrTaHfCu alloy in situ using synchrotron radiation by Yu.F. Ivanov, Yu.Kh. Akhmadeev, A.A. Klopotov, N.A. Prokopenko, E.A. Petrikova, O.V. Krysina, V.V. Shugurov, A.N. Shmakov, V.Yu. Lavrov
Published 2024-12-01
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