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TEM sample preparation using micro-manipulator for in-situ MEMS experiment by Hyunjong Lee, Odongo Francis Ngome Okello, Gi-Yeop Kim, Kyung Song, Si-Young Choi
Published 2021-06-01
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Atomic-level defect modulation and characterization methods in 2D materials by Odongo Francis Ngome Okello, Dong-Hwan Yang, Yu-Seong Chu, Sejung Yang, Si-Young Choi
Published 2021-10-01
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