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Scanning reflection ion microscopy in a helium ion microscope by Yuri V. Petrov, Oleg F. Vyvenko
Published 2015-05-01
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Copper-Stabilized Si/Au Nanowhiskers for Advanced Nanoelectronic Applications by Ksenia Yu Maksimova, Anatoly A. Kozlov, Petr V. Shvets, Ulyana Yu Koneva, Oksana V. Yurkevich, Oleg I. Lebedev, Oleg F. Vyvenko, Vladimir Yu Mikhailovskii, Aleksandr Yu Goikhman
Published 2018-02-01
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