Showing 1 - 3 results of 3 for search 'Oliver H Heckl', query time: 0.02s
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Simultaneous measurement of mid-infrared refractive indices in thin-film heterostructures: Methodology and results for GaAs/AlGaAs by Lukas W. Perner, Gar-Wing Truong, David Follman, Maximilian Prinz, Georg Winkler, Stephan Puchegger, Garrett D. Cole, Oliver H. Heckl
Published 2023-07-01
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Mid-infrared supermirrors with finesse exceeding 400 000 by Gar-Wing Truong, Lukas W. Perner, D. Michelle Bailey, Georg Winkler, Seth B. Cataño-Lopez, Valentin J. Wittwer, Thomas Südmeyer, Catherine Nguyen, David Follman, Adam J. Fleisher, Oliver H. Heckl, Garrett D. Cole
Published 2023-12-01
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