Showing 1 - 7 results of 7 for search 'Ong, Vincent Keng Sian', query time: 0.02s Refine Results
  1. 1
    Junction depth & defect characterization with the use of EBIC

    Junction depth & defect characterization with the use of EBIC by Phua, Poh Chin.

    Published 2008
    Other Authors: “…Ong, Vincent Keng Sian…”
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    Thesis
  2. 2
    New techniques for localization of shorted and open interconnect failures in ICs by using laser beam technology

    New techniques for localization of shorted and open interconnect failures in ICs by using laser beam technology by Thaw Zin Myint.

    Published 2008
    Other Authors: “…Ong, Vincent Keng Sian…”
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    Thesis
  3. 3
    Pallet detection system in industrial automation

    Pallet detection system in industrial automation by Tiong, Ung Chiong.

    Published 2008
    Other Authors: “…Ong, Vincent Keng Sian…”
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    Thesis
  4. 4
    Material characterization using electron beam induced current

    Material characterization using electron beam induced current by Wu, Det Hau.

    Published 2008
    Other Authors: “…Ong, Vincent Keng Sian…”
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    Thesis
  5. 5
    Verification of selected electron beam induced current (EBIC) techniques

    Verification of selected electron beam induced current (EBIC) techniques by Ang, Alex Yong Guan

    Published 2008
    Other Authors: “…Ong, Vincent Keng Sian…”
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    Thesis
  6. 6
    Study of low current discrete voltage regulator

    Study of low current discrete voltage regulator by Kuek, Ser Tai.

    Published 2008
    Other Authors: “…Ong, Vincent Keng Sian…”
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    Thesis
  7. 7
    The optimum placement of wavelength converters for wavelength-routed all-optical networks

    The optimum placement of wavelength converters for wavelength-routed all-optical networks by Lu, Weisheng.

    Published 2008
    Other Authors: “…Ong, Vincent Keng Sian…”
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    Thesis

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