Showing 1 - 2 results of 2 for search 'Oulehla Jindrich', query time: 0.02s Refine Results
  1. 1
    Contribution of the Refractive Index Fluctuations to the Length Noise in Displacement Interferometry

    Contribution of the Refractive Index Fluctuations to the Length Noise in Displacement Interferometry by Holá Miroslava, Hrabina Jan, Sarbort Martin, Oulehla Jindrich, Cíp Ondrej, Lazar Josef

    Published 2015-10-01
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    Article
  2. 2
    Surface morphology and X-ray photoelectron spectroscopy of BiFeO3 thin films deposited on top of Ta2O5/Si layers

    Surface morphology and X-ray photoelectron spectroscopy of BiFeO3 thin films deposited on top of Ta2O5/Si layers by Ramazanov Shikhgasan, Ţălu Ştefan, Dallaev Rashid, Ramazanov Guseyn, Škarvada Pavel, Oulehla Jindřich, Sobola Dinara, Nazarov Dmitry

    Published 2021-01-01
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