SOME ASPECTS OF THE MEASUREMENTS OF ELECTRICAL EFFECTS OF DISLOCATIONS IN SILICON USING A COMPUTERIZED EBIC SYSTEM od Wilshaw, P, Ourmazd, A, Booker, G

MEASUREMENT OF CONTRAST FROM INDIVIDUAL DISLOCATIONS BY LOCK-IN EBIC od Ourmazd, A, Wilshaw, P, Cripps, R

TEMPERATURE DEPENDENCE OF EBIC CONTRAST FROM INDIVIDUAL DISLOCATIONS IN SILICON. od Ourmazd, A, Wilshaw, P, Booker, G

ELECTRICAL BEHAVIOUR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING FAULT RIBBONS IN SILICON. od Ourmazd, A, Wilshaw, P, Booker, G

THE TEMPERATURE-DEPENDENCE OF EBIC CONTRAST FROM INDIVIDUAL DISLOCATIONS IN SILICON od Ourmazd, A, Wilshaw, P, Booker, G

THE ELECTRICAL BEHAVIOR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING-FAULT RIBBONS IN SILICON od Ourmazd, A, Wilshaw, P, Booker, G

SOME ASPECTS OF THE MEASUREMENTS OF ELECTRICAL EFFECTS OF DISLOCATION IN SILICON USING A COMPUTERISED EBIC SYSTEM. od Wilshaw, P, Ourmazd, A, Booker, G

ELECTRICAL BEHAVIOUR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING FAULTS. od Ourmazd, A, Wilshaw, P, Weber, E, Gottschalk, H, Booker, G, Alexander, H

Achieving accurate estimates of fetal gestational age and personalised predictions of fetal growth based on data from an international prospective cohort study: a population-based... od Fung, R, Villar, J, Dashti, A, Cheikh Ismail, L, Staines-Urias, E, Ohuma, EO, Salomon, LJ, Victora, CG, Barros, FC, Lambert, A, Carvalho, M, Jaffer, YA, Noble, AJ, Gravett, MG, Purwar, M, Pang, R, Bertino, E, Munim, S, Myat Min, A, McGready, R, Norris, SA, Bhutta, ZA, Kennedy, SH, Papageorghiou, AT, Ourmazd, A, International Fetal and Newborn Gro Group

Achieving accurate estimates of fetal gestational age and personalised predictions of fetal growth based on data from an international prospective cohort study: a population-based... od Fung, R, Villar, J, Dashti, A, Ismail, LC, Staines-Urias, E, Ohuma, EO, Salomon, LJ, Victora, CG, Barros, FC, Lambert, A, Carvalho, M, Jaffer, YA, Noble, JA, Gravett, MG, Purwar, M, Pang, R, Bertino, E, Munim, S, Min, AM, McGready, R, Norris, SA, Bhutta, ZA, Kennedy, SH, Papageorghiou, AT, Ourmazd, A, Norris, S, Abbott, SE, Abubakar, A, Acedo, J, Ahmed, I, Al-Aamri, F, Al-Abduwani, J, Al-Abri, J, Alam, D, Albernaz, E, Algren, H, Al-Habsi, F, Alija, M, Al-Jabri, H, Al-Lawatiya, H, Al-Rashidiya, B, Altman, DG, Al-Zadjali, WK, Andersen, HF, Aranzeta, L, Baricco, M, Barros, FC, Barsosio, H, Batiuk, C, Ash, S

An SEM EBIC study of the electronic properties of dislocations in silicon od Wilshaw, P, Wilshaw, Peter

Kolejni autorzy: “…Ourmazd, A…”