Java remote microscope for collaborative inspection of integrated circuits by Perez, Manuel Joseph

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Statistical Analysis of Annual DNI Distribution and its Impact on Bankability Assessment for Concentrated Solar Power Plants by Miguel Larrañeta, Jose A López-Álvarez, Elena Pérez-Aparicio, Jose M. Delgado-Sanchez, Joaquín Alonso-Montesinos, Silva-Pérez Manuel A.

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Computer-Assisted Prototyping of Advanced Microsystems by Troxel, Donald E., McIlrath, Michael B., Chery, Yonald, Thompson, Carl V., Lee, Zachary K., Antoniadis, Dimitri A., Boning, Duane S., Lohman, Thomas L., Gower, Aaron E., Perez, Manuel J., Lee, Brian, Verminski, Matthew D., Moyne, William P., Chandrakasan, Anantha P., Saha, Debashis

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Computer-Integrated Design and Manufacture of Integrated Circuits by Troxel, Donald E., McIlrath, Michael B., Chery, Yonald, Thompson, Carl V., Boning, Duane S., Lohman, Thomas J., Gower, Aaron E., Kao, James T., Lee, Brian, Kittipiyakul, Somsak, Perez, Manuel J., Moyne, William P., Wright, Chantal E., Peters, Christopher, Verminski, Matthew D., Chung, James E., Nemec, Joseph E., Gershwin, Stanley B.

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