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Defect concentration in clusters, created by fast-pile neutrons in n-Si (FZ, Cz) by A. P. Dolgolenko, G. P. Gaidar, P. G. Litovchenko
Published 2007-12-01
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Radiation hardness of silicon doped by germanium with high concentration of free oxygen by M. D. Varentsov, G. P. Gaidar, A. P. Dolgolenko, P. G. Litovchenko
Published 2006-06-01
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Possibilities of increase of radiation firmness of semiconductor materials by P. G. Litovchenko, L. I. Barabash, S. V. Berdnichenko, D. Bizello, M. D. Varentsov, V. I. Varnina, A. A.Groza, O. P. Dolgolenko, A. Ya. Karpenko, T. I. Kibkalo, V. F. Lastovetsky, A. P. Litovchenko, V. N. Pidtynnykh, L. A. Polivtsev, S. B. Smirnov, M. I. Starchik
Published 2008-08-01
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