LIBS depth profiling of Be-containing samples with different gaseous impurity concentrations by P.G. Bhat, P. Veis, A. Marín Roldán, J. Karhunen, P. Paris, I. Jõgi, A. Hakola, J. Likonen, S. Almaviva, W. Gromelski, M. Ladygina, P. Gasior, J. Ristkok, I. Bogdanović Radović, Z. Siketić, O. Romanenko, C. Porosnicu, C. Lungu

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