Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films by Trager-Cowan, C, Sweeney, F, Trimby, P, Day, A, Gholinia, A, Schmidt, N, Parbrook, P, Wilkinson, A, Watson, I

Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging by Trager-Cowan, C, Sweeney, F, Wilkinson, A, Trimby, P, Day, A, Gholinia, A, Schmidt, N, Parbrook, P, Watson, I

Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope. by Naresh-Kumar, G, Hourahine, B, Edwards, P, Day, A, Winkelmann, A, Wilkinson, A, Parbrook, P, England, G, Trager-Cowan, C

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging by Trager-Cowan, C, Sweeney, F, Winkelmann, A, Wilkinson, A, Trimby, P, Day, A, Gholinia, A, Schmidt, N, Parbrook, P, Watson, I

Dependence of carrier localization in InGaN/GaN multiple-quantum wells on well thickness by Na, J, Taylor, R, Lee, K, Wang, T, Tahraoui, A, Parbrook, P, Fox, A, Yi, SN, Park, Y, Choi, J, Lee, J

High-resolution electron backscatter diffraction in III-nitride semiconductors by Vilalta-Clemente, A, Naresh-Kumar, G, Nouf Allehiani, M, Parbrook, P, Boulbar, E, Allsopp, D, Shields, P, Trager-Cowan, C, Wilkinson, A

Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films by Trager-Cowan, C, Edwards, P, Dynowski, F, Sweeney, F, Wilkinson, A, Winkelmann, A, Day, A, Wang, T, Parbrook, P, Watson, I, Joy, D