Showing 1 - 5 results of 5 for search 'Patrick Hoffmann', query time: 0.02s Refine Results
  1. 1
    Comparison of Reinforcement Learning and Model Predictive Control for Automated Generation of Optimal Control for Dynamic Systems within a Design Space Exploration Framework

    Comparison of Reinforcement Learning and Model Predictive Control for Automated Generation of Optimal Control for Dynamic Systems within a Design Space Exploration Framework by Patrick Hoffmann, Kirill Gorelik, Valentin Ivanov

    Published 2024-01-01
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  2. 2
    Composition and electrical properties of ultra-thin SiOxNy layers formed by rf plasma nitrogen implantation/plasma oxidation processes

    Composition and electrical properties of ultra-thin SiOxNy layers formed by rf plasma nitrogen implantation/plasma oxidation processes by Tomasz Bieniek, Romuald B. Beck, Andrzej Jakubowski, Piotr Konarski, Michał Ćwil, Patrick Hoffmann

    Published 2023-06-01
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  3. 3
    Comparison of composition of ultra-thin silicon oxynitride layers’ fabricated by PECVD and ultrashallow rf plasma ion implantation

    Comparison of composition of ultra-thin silicon oxynitride layers’ fabricated by PECVD and ultrashallow rf plasma ion implantation by Robert Mroczyński, Tomasz Bieniek, Romuald B. Beck, Michał Ćwil, Piotr Konarski, Patrick Hoffmann, Dieter Schmeißer

    Published 2023-06-01
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  4. 4
    Pradofloxacin Minimum Inhibitory Concentration Profiling of <i>Streptococcus suis</i> Isolates: Insights into Antimicrobial Susceptibility in Swine

    Pradofloxacin Minimum Inhibitory Concentration Profiling of <i>Streptococcus suis</i> Isolates: Insights into Antimicrobial Susceptibility in Swine by Jessica Risser, Ronald Tessman, Don Bade, Orhan Sahin, Maria J. Clavijo, Saumya Dhup, Patrick Hoffmann

    Published 2025-01-01
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  5. 5
    The influence of annealing (900◦C) of ultra-thin PECVD silicon oxynitride layers

    The influence of annealing (900◦C) of ultra-thin PECVD silicon oxynitride layers by Robert Mroczyński, Grzegorz Głuszko, Romuald B. Beck, Andrzej Jakubowski, Michał Ćwil, Piotr Konarski, Patrick Hoffmann, Dieter Schmeißer

    Published 2023-06-01
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