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    X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature.

    X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature. by Talib, Zainal Abidin, Mat Yunus, Wan Mahmood, Mohd Yunos, Mohd Amirul Syafiq, Meor Sulaiman, Meor Yusoff, Paulus, Wilfred Sylvester

    Published 2010
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