Conductive-probe atomic force microscopy characterization of silicon nanowire by Yu Linwei, Cabarrocas Pere, Perraud Simon, Rouvière Emmanuelle, Celle Caroline, Mouchet Céline, Simonato Jean-Pierre, Alvarez José, Ngo Irène, Gueunier-Farret Marie-Estelle, Kleider Jean-Paul

Get full text