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Physical Mapping of QTLs for Root Traits in a Population of Recombinant Inbred Lines of Hexaploid Wheat by Xiaoqing Li, Anton P. Wasson, Alexander B. Zwart, Alex Whan, Peter R. Ryan, Kerrie Forrest, Matthew Hayden, Sabrina Chin, Richard Richards, Emmanuel Delhaize
Published 2023-06-01
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Aluminum Complexation with Malate within the Root Apoplast Differs between Aluminum Resistant and Sensitive Wheat Lines by Peter M. Kopittke, Brigid A. McKenna, Chithra Karunakaran, James J. Dynes, Zachary Arthur, Alessandra Gianoncelli, George Kourousias, Neal W. Menzies, Peter R. Ryan, Peng Wang, Peng Wang, Kathryn Green, F. P. C. Blamey
Published 2017-08-01
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Assessing How the Aluminum-Resistance Traits in Wheat and Rye Transfer to Hexaploid and Octoploid Triticale by Peter R. Ryan, Dengfeng Dong, Dengfeng Dong, Felix Teuber, Neele Wendler, Neele Wendler, Karl H. Mühling, Jie Liu, Jie Liu, Muyun Xu, Naike Salvador Moreno, Naike Salvador Moreno, Jiangfeng You, Hans-Peter Maurer, Walter J. Horst, Emmanuel Delhaize
Published 2018-10-01
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