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  1. 1
    Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations

    Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations by Sven Gustafson, Wolfgang Ludwig, Paul Shade, Diwakar Naragani, Darren Pagan, Phil Cook, Can Yildirim, Carsten Detlefs, Michael D. Sangid

    Published 2020-06-01
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  2. 2
    darfix – data analysis for dark-field X-ray microscopy

    darfix – data analysis for dark-field X-ray microscopy by Júlia Garriga Ferrer, Raquel Rodríguez-Lamas, Henri Payno, Wout De Nolf, Phil Cook, Vicente Armando Solé Jover, Can Yildirim, Carsten Detlefs

    Published 2023-05-01
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    Article

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